BEST PAPER AWARDS
To be presented at IRPS 2025:
OFF-state Breakdown and Threshold Voltage Stability of Vertical GaN-on-Si Trench MOSFETs
Manuel Fregolent, Francesco Bergamin, Davide Favero, Carlo De Santi, Christian Huber, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
To be presented at IPFA 2025:
Reading reliability in 1S1R OTS+PCM devices based on Double Patterned Self Aligned Structure
Renzo Antonelli, Guillaume Bourgeois, Valentina Meli, Zineb Saghi, Théo Monniez, Simon Martin, Niccolò Castellani, Mathieu Bernard, Leïla Fellouh, Antoine Salvi, Sylvain Gout, François Andrieu, Abdelkader Souifi, Gabriele Navarro
To be presented at ISTFA 2025:
Reliability and Failure Analysis of AlGaN/GaN HEMT with NiPtAu and PtAu Gate
Michael Damman, Peter Brückner, Rachid Driad, Sebastian Krause, Sayed Albahrani, Benjamin Weber, Martina Bäumler, Michael Mikulla, Helmer Konstanzer, Andreas Graff, Michel Simon-Najasek, Susanne Hübner
BEST REVIEWER AWARDS
Dr. MICHAEL NELHIEBEL
KAI GmbH (AT)
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For the outstanding quality of his job as a member of the ESREF 2024 Technical Committee